NST FT IC测试分类机
简单而智能

NS Technologies

NS Technologies 是日本商社兼松株式会社(Kanematsu Corporation)创立的全资子公司，接受了与爱普生 IC 测试处理机业务相关的所有资产的转让，并将继续作为专业制造商经营该业务。 我们保留了日本和海外的生产与销售体系，构建了一套提供与之前相同服务的系统。
旗舰款

NX1032XS FT IC测试分类机

支援半导体测试产业，提供高速且稳定的FT IC测试分类机

常高温IC测试分类机
  • 测试站点(测试头)：最高可同时支援32 site测试
  • 测试区尺寸：344mm × 244mm
  • 最大测试压力：480 kgf
  • 测试产能(UPH )：
    常温条件下最高可达 20,000 UPH
    高温条件下最高可达 10,500 UPH

以先进自动化技术打造，性能全面升级，轻松应对最严苛的测试挑战

规格介绍

NX1032XS
Devices Handled 16-site 32-site
QFP, TSOP, CSP, WLCSP, BGA, QFN, PLCC, LGA, PGA,
Min. 3×3 to Max. 50×50 (Lead pitch: 0.4mm or more) *1
Test Mode N/A 32-site (8×4, X: 40mm pitch × Y: 60mm pitch)
16-site (8×2, X: 30mm pitch Y: 60mm pitch, 40mm pitch × Y: 60mm pitch)
8-site (4×2, X: 40mm pitch × Y: 60mm, X: 60mm pitch × Y: 60mm, X: 80mm pitch × Y: 60mm)
4-site (2×2, X: 80mm × Y: 60mm), (4×1, X: 40mm, 60mm, 80mm)
2-site (Socket pitch 80 mm)
Single (use one side of the 2-site test)
Non-standard pitches can be set by laying out the independent compliance unit with desired pitches
Testing Area 344 × 146 mm 344 × 244 mm
Standard Socket Pitch (mm) X: 40mm Y: 60mm
Heating Method Heat Press Method
Index Time *2
(common in Ambient and High Temperature modes)		 Min. 0.38sec
Approx. 0.42sec. (wide 4×2, 8×2 layout) Approx. 2.05sec. (8×4 layout)
Approx. 2.21sec. (4,800N Option) Approx. 4.35sec. (4,800N Option)
Max. Contact Force 1,600N (Optional) or 4,800N (Standard) 3,200N (Optional) or 4,800N (Standard)
Maximum Throughput (units per hour) 8×4 and 8×2 layouts: 20,000, 4×2 layout: 15,000(ambient temperature)
8×4 and 8×2 layouts: 10,500, 4×2 layout:10,500(high temperature)
Binning Max. 6 bins (Auto 3, Manual 3)
Tray JEDEC (135.9 × 315.0 mm)
Temperature Accuracy +50°C to +90°C ±2°C
+90°C to 155°C ±3°C
Hot Plate Size 220mm × 380 mm *3
Power Requirement Single Phase AC 200 - 240 V, 50/60 Hz, 6 kVA
Handler Dimensions (mm) (W x D x H) 1,580(W) x 1,940(D) x 2,000(H) *4
Weight Approx. 1,200kg
Note:

*1:Depends on socker size and socker pitch.
*2:Depends on the socker mounting height.
*3:Excluding handle, tower light, and LCD monitor.
*4:Contact us for temperature accuracy of NS8080SH- 8-site.
基本款

NS8080SH / NS8040SH FT IC
测试分类机

提供高效稳定的测试环境，全面支援FT IC分类，维持卓越稳定的效能

常高温IC测试分类机
  • 测试站点(测试头)：最多可同时支援 4 / 8 site测试
  • 测试区尺寸：184mm × 149mm
  • 最大测试压力：120 kgf
  • 测试产能(UPH)：
    常温条件下最高可达 13,500 UPH
    高温条件下最高可达 8,200 UPH

规格介绍

NS8160MS NS8080MS NS8080SH NS8040SH
Devices Handled QFP, TSOP, CSP, WLCSP, BGA, QFN, PLCC, LGA, PGA
Min. 3 x 3 to Max. 50 x 50 (Lead pitch: 0.4mm or more) *1
Test Mode 16-site (8 x 2)
 N/A N/A N/A
8-site (4 x 2) N/A
Square 4-site (2 x 2)
In-Line 4-site (4 x 1)
2-site
Single
Testing Area 264 mm x 149 mm 184 mm x 149 mm
Standard Socket Pitch (mm) X: 30 Y: 60(max X: 30 Y: 63.5) X: 40 Y: 60(max X: 60 Y: 63.5) X: 40 Y: 60 X: 80 Y: 60
Heating Method Heating Plate
Index Time 0.42 sec (up to 160 kgf)*2 0.4 sec (up to 120 kgf)*2
0.58 sec (up to 240 kgf)*2 N/A
Maximum Throughput (units per hour)
 13,500 units(ambient temperature)
8,200 units(high temperature)		 10,000 units(ambient Temperature)
6,100 units(high temperature)
Binning Max. 6 bins (Auto 3, Manual 3)
Tray Size JEDEC (135.9 x 315.0 mm)
Max. Contact Pressure 240 kgf 120 kgf
Temperature Accuracy +50°C to +90°C ±2°C *4
+90°C to +155°C ±3°C *4		 +50°C to +90°C ±2°C
+90°C to +130°C ±3°C
Power Single Phase AC 200 - 240 V, 50/60 Hz, 6 kVA
Handler Dimensions (mm) (W x D x H) 1,850(W) x 1,500(D) x 1,970(H) *3 1,850(W) x 1,500(D) x 1,850(H) *3
Weight Approx. 1,090kg Approx. 1,000kg
Note:

*1:Depends on socker size and socker pitch.
*2:Depends on the socker mounting height.
*3:Excluding handle, tower light, and LCD monitor.
*4:Contact us for temperature accuracy of NS8080SH- 8-site.
主流款

NS8160MS / NS8080MS FT IC
测试分类机

提供高效稳定测试环境，全面支援FT IC分类，维持卓越稳定的效能

常高温IC测试分类机
  • 测试站点(测试头)：最多可同时支援4 / 8 site测试
  • 测试区尺寸：184mm × 149mm
  • 最大测试压力：120 kgf
  • 测试产能(UPH)：
    常温条件下最高可达 13,500 UPH
    高温条件下最高可达 8,200 UPH

规格介绍

NS8160MS NS8080MS NS8080SH NS8040SH
Devices Handled QFP, TSOP, CSP, WLCSP, BGA, QFN, PLCC, LGA, PGA
Min. 3 x 3 to Max. 50 x 50 (Lead pitch: 0.4mm or more) *1
Test Mode 16-site (8 x 2)
 N/A N/A N/A
8-site (4 x 2) N/A
Square 4-site (2 x 2)
In-Line 4-site (4 x 1)
2-site
Single
Testing Area 264 mm x 149 mm 184 mm x 149 mm
Standard Socket Pitch (mm) X: 30 Y: 60(max X: 30 Y: 63.5) X: 40 Y: 60(max X: 60 Y: 63.5) X: 40 Y: 60 X: 80 Y: 60
Heating Method Heating Plate
Index Time 0.42 sec (up to 160 kgf)*2 0.4 sec (up to 120 kgf)*2
0.58 sec (up to 240 kgf)*2 N/A
Maximum Throughput (units per hour)
 13,500 units(ambient temperature)
8,200 units(high temperature)		 10,000 units(ambient Temperature)
6,100 units(high temperature)
Binning Max. 6 bins (Auto 3, Manual 3)
Tray Size JEDEC (135.9 x 315.0 mm)
Max. Contact Pressure 240 kgf 120 kgf
Temperature Accuracy +50°C to +90°C ±2°C *4
+90°C to +155°C ±3°C *4		 +50°C to +90°C ±2°C
+90°C to +130°C ±3°C
Power Single Phase AC 200 - 240 V, 50/60 Hz, 6 kVA
Handler Dimensions (mm) (W x D x H) 1,850(W) x 1,500(D) x 1,970(H) *3 1,850(W) x 1,500(D) x 1,850(H) *3
Weight Approx. 1,090kg Approx. 1,000kg
Note:

*1:Depends on socker size and socker pitch.
*2:Depends on the socker mounting height.
*3:Excluding handle, tower light, and LCD monitor.
*4:Contact us for temperature accuracy of NS8080SH- 8-site.
三温機

NS8080MT / NS8160GT FT IC
测试分类机

高效测试能力，全面支援车用晶片

三温IC测试分类机
  • 测试温度范围：-55°C ～ 175°C
  • 测试站点(测试头)：最高可同时支援 8 / 16 site测试
  • 测试区尺寸：
    MT 型：X344mm × Y149mm
    GT 型：X344mm × Y244mm
  • 最大测试压力：240 kgf
  • 最高可达 7,750 UPH（低温）

规格介绍

NS8080MT NS8160GT
Jam rate < 1/10,000
Index Time 0.7 sec(Direct) / 0.9 sec(Soft)
Single Arm Contact
0.7 sec(Direct) / 0.9 sec(Soft)
Double Arm Contact
3.0 sec(Direct) / 3.3 sec(Soft)
Max UPH
(Test time 0sec) 		Contact: Single Arm Single Arm Double Arm
Cold: 7,750 7,750 6,850
Hot: 7,800 7,800 6,850
Amb: 11,150 11,150 9,600
8 site 4x2 8 site 4x2 16 site 4x4
Dimensions & Weight 2233mm(W) x 1723mm(D) x 2163mm(H)
2350kg(include refrigerators inside)
Temperature Range Hot: +90℃～130℃, Stability Test hand:+/-3℃, other:+/-5℃    175℃(Option)
Hot: +30℃～+90℃, Stability Test hand:+/-2℃, other:+/-5℃
Cold: -55℃～+25℃, Stability Test hand:+/-2℃, other:+/-5℃
Change Kit Change Time Approximately<30 min. (switch to existing recipe)
ESD ability Balance ±10V, 1kV　→　100V within 5sec
ESD with feedback Balance ±5V, 1kV→100V within 5sec  (Option)
Electricity Power Supply Heater: 200~240V±10%, 50/60Hz, 75A, 16.8kVA
Refrigerator: 200~240V±10%, 50/60Hz, 75A, 16.8kVA
Handler: 200~240V±10%, 50/60Hz, 30A, 4.8kVA
Compressed Air Supply Dew Point Temperature -60℃,  0.5MPa, 1300NL/min
Socket Layout 8site(X4/Y2) 16site(X4/Y4)
Socket Area Size[mm] X344 / Y149 X344 / Y244
Shuttle Size[mm] X234 / Y120 X234 / Y120
Max Contact Force 2400 N/Arm 2400 N/Arm
Index Motion Single Arm Contact
(Contact alternately with Two Arm) 		Single Arm Contact Double Arm Contact
(2arms contact simultaneously)
Socket Pitch[mm] 1site (X1) X60mm offset from center of socket area ← －
2site(X2/Y1) X120,80 ← －
4site (X4/Y1) X60,40 ← －
4site (X2/Y2) X120,80,60　/ Y60 ← －
8site (X4/Y2) X60 / Y60, 80 ← －
16site (X4/Y4) － － X40/Y60,X60/Y60,
X40/Y40
16site (X8/Y2) － －
32site (X8/Y4) － －
NST FT IC测试分类机
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